Journal of SMT Article

ADVANCES IN AUTOMATIC OPTICAL INSPECTION: GRAY SCALE CORRELATION VS. VECTORAL IMAGING

Author: Mark J. Norris
Company: Vision Inspection Technology
Date Published: 1/1/2002   Volume: 15-1

Abstract: Vectoral Imaging from ViTechnology has significantly advanced the accuracy, speed, and reliability in the inspection of components on Printed Circuit Boards (PCBs). Rather then using gray scale correlation and pixel counting, Vectoral Imaging utilizes a pattern location search technology based on geometric feature extraction. The use of this new method to inspect PCBs is a breakthrough in Automated Optical Inspection (AOI). Because of this faster, and more reliable system, the goal of data collection for immediate process intervention, resulting in repair and defect analysis, leads us closer to the ultimate goal of a zero defect production line.

By implementing a full Statistical Process Control (SPC) package into the AOI system, we are now able to track component information in real time.

Giving operators immediate access to necessary information on the exact state of any process allows for instant communication with both upstream and downstream assembly systems to make the necessary changes, as the process deviates from acceptable upper and lower control limits.

The combination of accurate PCB inspection based on Vectoral Imaging technology plus SPC analysis provides electronics manufacturers with the high level of process control required for a zero defect manufacturing environment.

Key words: AOI, inspection, vectoral imaging, synthetic images, SPC, pick & place, closed loop.



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