Journal of SMT Article
ELECTROLESS Ni-P/Pd/Au PLATING FOR SEMICONDUCTOR PACKAGE SUBSTRATE
Company: Hitachi Chemical Co.
Date Published: 1/1/2001 Volume: 14-1
Therefore, we developed a high-speed shear test that simulates the drop-impact conditions. We also developed an electroless Ni-P/Pd/Au plating of good reliability for solder joint. Solder joint reliability is evaluated by the ball shear test. The shear strength and the fracture mode are influenced by shear speed. When low-speed shear test was conducted, the effect of surface finish on the solder joint reliability was not apparent. But, when the high-speed shear test was used, the solder joint reliability to different surface finishes became clear. The high-speed shear test revealed that immersion Au lowered solder joint reliability during the electroless Ni-P/Au plating process. The cross-section of the electroless Ni-P/ immersion Au layers was observed by FIB/SIM (focused ion beam/scanning ion-beam microscopy). From FIB/SIM observation, we found that the corrosion on the surface of the electroless Ni-P with immersion Au had reduced the solder joint reliability. Some different methods to prevent the corrosion on the surface of the electroless Ni-P were studied and we found out that electroless Pd plating over electroless Ni-P was very effective. To conclude, the solder joint reliability of PBGA with electroless Ni-P/Pd/Au is equal to that of OSP (Organic Solder Preservation) and electrolytic Ni/Au.
Keyword: CSP, BGA, solder ball joint, shear speed, electroless Ni-P/Pd/Au.
Cost to download:Members: Free! (Log on to receive the member rate)
Not a member yet? Join SMTA today!
Notice: Sharing of articles is prohibited. Downloaded papers must only be stored on a local hard drive and not in a shared repository either internal or external.