Journal of SMT Article
ADVANCES IN AUTOMATIC OPTICAL INSPECTION: GRAY SCALE CORRELATION VS. VECTORAL IMAGING
Company: Vision Inspection Technology
Date Published: 1/1/2002 Volume: 15-1
By implementing a full Statistical Process Control (SPC) package into the AOI system, we are now able to track component information in real time.
Giving operators immediate access to necessary information on the exact state of any process allows for instant communication with both upstream and downstream assembly systems to make the necessary changes, as the process deviates from acceptable upper and lower control limits.
The combination of accurate PCB inspection based on Vectoral Imaging technology plus SPC analysis provides electronics manufacturers with the high level of process control required for a zero defect manufacturing environment.
Key words: AOI, inspection, vectoral imaging, synthetic images, SPC, pick & place, closed loop.
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